The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Mar. 18, 2024
Applicant:

Northwestern University, Evanston, IL (US);

Inventors:

Daizong Tian, Evanston, IL (US);

Jingxian Wang, Evanston, IL (US);

Kaixuan Zhang, Evanston, IL (US);

Thrasyvoulos N. Pappas, Evanston, IL (US);

Assignee:

Northwestern University, Evanston, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2026.01); G06T 11/60 (2006.01);
U.S. Cl.
CPC ...
G06T 11/60 (2013.01);
Abstract

A method for film grain rendering includes receiving, by a computing system a first image. The method also includes modeling, by a processor of the computing system, film grains for the image. The method also includes deriving, by the processor, second order statistics for the film grains. The method also includes synthesizing, by the processor and based at least in part on the second order statistics, the film grains as correlated signal dependent noise. The method further includes rendering, by the processor, a second image that corresponds to the first image and that includes the synthesized film grains.


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