The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Oct. 10, 2023
Applicant:

Okuma Corporation, Niwa-gun, JP;

Inventor:

Akihito Kataoka, Aichi, JP;

Assignee:

OKUMA CORPORATION, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/579 (2017.01); B23Q 17/24 (2006.01); G01B 11/24 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 7/579 (2017.01); G06T 7/11 (2017.01); G06T 2200/21 (2013.01); G06T 2207/20132 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A three-dimensional shape measuring system includes a controller and a camera which images a target object to acquire a base image, in which the controller is configured to previously store three-dimensional shape data for a plurality of known structures, identify at least one structure from the plurality of known structure as at least one reference structure, compute at least one extruded region formed by extruding the at least one reference structure along a predetermined extruding direction based on the three-dimensional shape data, crop out a part of the base image to generate a computational image based on the at least one extruded region and the base image, and measure a shape of the target object based on the computational image.


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