The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Jan. 27, 2023
Applicant:

Leica Geosystems Ag, Heerbrugg, CH;

Inventor:

Christoph Herbst, Dornbirn, AT;

Assignee:

LEICA GEOSYSTEMS AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 7/246 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/337 (2017.01); G06T 7/248 (2017.01); G06T 7/74 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A method for ascertaining a suitable deployment of a mobile measuring device within measurement surroundings, wherein first and second measurement surroundings containing first and second object features are automatically optically captured at the first deployment and tracked using a visual inertial system (VIS) and within the scope of changing the deployment. The first and second measurement surroundings are compared, wherein the comparison is based on searching for corresponding first and second object features visible in a certain number and quality in the first and second measurement surroundings, wherein this certain number and quality of corresponding features is a criterion that a registration of the first and second point cloud is possible.


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