The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Oct. 03, 2022
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Kyosuke Tawara, Osaka, JP;

Yasuhisa Ikushima, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/778 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/0004 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30164 (2013.01); G06T 2207/30168 (2013.01); G06V 10/778 (2022.01); G06V 10/82 (2022.01);
Abstract

It is possible to quickly present an alternative model without causing deterioration in usability of a user. Learning data is input to a machine learning network to train the machine learning network, and a first inference model configured to perform quality determination of input images is generated. The input images sequentially input to the first inference model and quality determination results of the input images are stored. A process of inputting the plurality of stored input images to the machine learning network to train the machine learning network and generating a second inference model is executed in the background of quality determination processing at the time of inspection. A display screen configured to display quality determination performance of the second inference model is displayed on a display section.


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