The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Aug. 23, 2018
Applicant:

Visa International Service Association, San Francisco, CA (US);

Inventors:

Ajit Gaddam, Foster City, CA (US);

Ara Jermakyan, Northridge, CA (US);

Pushkar Joglekar, Emeryville, CA (US);

Assignee:

Visa International Service Association, San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 21/56 (2013.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 21/56 (2013.01); G06N 5/04 (2013.01); G06F 2221/031 (2013.01);
Abstract

Methods and systems for detecting and correcting model shift in machine learning models are disclosed. A computer can receive a set of input data from a data source. The computer can apply the input data to a machine learning model to produce a first set of classification data. The computer can perform a metadata test and validate the current machine learning model and the set of input data using a plurality of previously generated machine learning models. The plurality of previously generated machine learning models can produce a plurality of sets of classification data, which can be compared to the first set of classification data. Based on the comparison, the computer can determine whether the set of input data is associated with a malicious entity.


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