The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2026
Filed:
Jan. 28, 2022
International Business Machines Corporation, Armonk, NY (US);
Kyong Min Yeo, Scarsdale, NY (US);
Tsuyoshi Ide, Harrison, NY (US);
Bhanukiran Vinzamuri, Long Island City, NY (US);
Wesley M. Gifford, Ridgefield, CT (US);
Roman Vaculin, Larchmont, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Anomaly detection in industrial dynamic process can include receiving a set of multivariate time series data representative of sensor data obtained over time. The set of multivariate time series data can be transformed into a set of signature vectors in an embedding space. A neural network can be trained to estimate a probability distribution of the set of signature vectors in the embedding space. Streaming data can be received. The streaming data can be appended with a previously stored time series data. The appended streaming data can be transformed into an embedding. The embedding can be input into the trained neural network, the trained neural network outputting a first probability distribution score. A second probability distribution score associated with the embedding can be determined based on a given proposed probability distribution. Anomaly score can be determined based on the first probability distribution score and the second probability distribution score.