The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Sep. 09, 2020
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);

Inventors:

Shanhui Fan, Stanford, CA (US);

Tyler William Hughes, San Diego, CA (US);

David A.B. Miller, Stanford, CA (US);

Sunil K. Pai, Stanford, CA (US);

Olav Solgaard, Stanford, CA (US);

Ian A.D. Williamson, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/067 (2006.01);
U.S. Cl.
CPC ...
G06N 3/067 (2013.01);
Abstract

Improved training of optical neural networks is provided. In one example: 1) we choose input and target vectors, we program those into an input vector generator and a measurement unit, respectively, we turn on the optical input source power, and we monitor the electrical signal representing the cost function. 2) we can then modulate two or more controllable elements inside the optical network at different frequencies and look for the size and sign of the corresponding distinct AC variations in the measured cost function, simultaneously giving us the gradients with respect to each element.


Find Patent Forward Citations

Fan, Shanhui. (2026). Simultaneous measurements of gradients in optical networks (U.S. Patent No. 12705475). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12705475

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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