The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2026
Filed:
May. 31, 2023
Snowflake Inc., Bozeman, MT (US);
Hossein Ahmadi, Seattle, WA (US);
Raja Suresh Krishna Balakrishnan, Fremont, CA (US);
David Schultz, Piedmont, CA (US);
Jian Xu, San Jose, CA (US);
Yunqiao Zhang, Bellevue, WA (US);
Snowflake Inc., Bozeman, MT (US);
Abstract
Described herein are techniques for data quality monitoring in a network-based data system. A data metric function used to evaluate data quality can be stored, where the data metric function is defined as schema level object. The data metric function can be attached to a table associated with an account and is evaluated on data associates with the table to generate evaluation results. The evaluation results can be stored in an account-specific central database, from which access is provided to the evaluation results to a user for the account.