The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2026
Filed:
Dec. 22, 2021
Qualcomm Incorporated, San Diego, CA (US);
Weimin Duan, San Diego, CA (US);
Wanshi Chen, San Diego, CA (US);
Alexandros Manolakos, Escondido, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
In an aspect, a location of a reference UE is obtained (e.g., iteratively). A first differential RTT measurement is determined based on RTTs between a target UE and each of first and second wireless nodes, and a second differential RTT measurement is determined based on RTTs between a reference UE and each of the first and second wireless nodes. A positioning estimate of the target UE is determined based on the first and second differential RTT measurements and the obtained reference UE location (e.g., a most recent of the iteratively obtained reference UE locations). In another aspect, a primary reference UE among a plurality of reference UEs is selected, and its location is obtained (e.g., iteratively). A location of other reference UE(s) is determined based at least in part upon the obtained primary reference UE location (e.g., a most recent of the iteratively obtained primary reference UE locations).