The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Apr. 10, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Sungdo Choi, Suwon-si, KR;

Jong-Sok Kim, Suwon-si, KR;

Seung Tae Khang, Suwon-si, KR;

Jinyong Jeon, Suwon-si, KR;

Young Rae Cho, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/41 (2006.01); G01S 7/35 (2006.01); G01S 13/58 (2006.01); G01S 13/72 (2006.01); G01S 13/89 (2006.01);
U.S. Cl.
CPC ...
G01S 7/417 (2013.01); G01S 7/356 (2021.05); G01S 7/412 (2013.01); G01S 13/584 (2013.01); G01S 13/723 (2013.01); G01S 13/89 (2013.01);
Abstract

A method including clustering second point clouds comprised in second point cloud data of a second timepoint, obtaining output data corresponding to one or more second clusters generated as a result of the clustering by applying the second point clouds to a pretrained neural network, determining whether at least one of the one or more second clusters is a target object based on a reliability factor, tracking first clusters corresponding to the target object in first point cloud data of one or more first timepoints prior to the second timepoint, and training of the pretrained neural network based on the output data corresponding to the first clusters and the first point clouds for each first cluster determined according to a result of the tracking.


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