The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

May. 10, 2024
Applicant:

Fujifilm Healthcare Corporation, Kashiwa, JP;

Inventors:

Yasuhiro Kamada, Chiba, JP;

Kota Hamada, Chiba, JP;

Hideyuki Horio, Chiba, JP;

Ayaka Ikegawa, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/58 (2006.01);
U.S. Cl.
CPC ...
G01R 33/58 (2013.01);
Abstract

An apparatus and a method can be provided to improve the accuracy of automatic calibration without extension of an examination time in an MR examination. A range of calibration performed before main imaging is determined with reference to a main imaging range and other spatial information. The spatial information consists of information for estimating an MR signal generation range, such as a subject region, a uniform magnetic field region, and a structural restriction of an apparatus, and a calibration range is determined such that a proportion of the MR signal generation range included in the calibration range is as high as possible.


Find Patent Forward Citations

Kamada, Yasuhiro. (2026). Magnetic resonance imaging apparatus and calibration method thereof (U.S. Patent No. 12704578). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12704578

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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