The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2026
Filed:
Sep. 14, 2022
Mediatek Singapore Pte. Ltd., Singapore, SG;
Shuang Zhang, Beijing, CN;
Jianfei Xiao, Beijing, CN;
Yan Wu, Beijing, CN;
Lingfei Fan, Beijing, CN;
Deqiang Li, Beijing, CN;
Xinqiu Wang, Beijing, CN;
Jianwei Zhang, Beijing, CN;
MEDIATEK SINGAPORE PTE. LTD., Singapore, SG;
Abstract
A method for aligning test environments is provided. The method includes: measuring, by a measurement device located in an anechoic chamber, a standard signal transmitted from a base station simulator and went through to a channel emulator, then output with noise added inside the channel emulator, to multiple antennas within the anechoic chamber; obtaining, by a computing device, measurement information based on the standard signal and the noise transmitted from the measurement device; determining, by the computing device, whether the measurement information is within a predetermined range of a target value; and transmitting, by the computing device, a control signal to the channel emulator to adjust the noise output from the channel emulator so that the computing device obtains desired measurement information based on the standard signal and the adjusted noise when the measurement information is not within the predetermined range of the target value.