The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Dec. 21, 2021
Applicant:

Fuji Corporation, Chiryu, JP;

Inventors:

Tsuyoshi Mizukoshi, Chiryu, JP;

Masashi Kimura, Nishio, JP;

Shuhei Mizutani, Yatomi, JP;

Assignee:

FUJI CORPORATION, Chiryu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 27/26 (2013.01); G01R 35/00 (2013.01);
Abstract

An object of the present disclosure is to acquire an open correction value in a good manner. In an electrical characteristic acquiring device according to the present disclosure, an open correction value, which is an electrical characteristic when the interval between a pair of probes is the length of a component to be measured on an electrode side, is calculated based on the measurement value of the electrical characteristic when the interval between the pair of probes is a set length, a set length, and the length of the component on the electrode side. Therefore, even when it is difficult to adjust the interval between the pair of probes, the open correction value can be accurately acquired. In addition, it is not necessary to measure the open correction value every time the component to be measured is changed, and the work efficiency can be improved accordingly.


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