The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

May. 08, 2024
Applicant:

Rtx Corporation, Farmington, CT (US);

Inventors:

Ronald B. Coleman, Arlington, MA (US);

Alan R. Curtis, Acton, MA (US);

Assignee:

RTX Corporation, Farmington, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01); G01N 29/04 (2006.01); G01N 29/24 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/12 (2013.01); G01N 29/041 (2013.01); G01N 29/2437 (2013.01); G01N 29/4427 (2013.01); G01N 29/4454 (2013.01); G01N 2291/014 (2013.01); G01N 2291/2694 (2013.01);
Abstract

A resonance inspection system a processing system configured to process resonance data including a vibratory response signature of a component over a portion of a frequency range of the vibratory response signature to generate a plurality of different resonance spectra waveforms of the vibratory response signature. The plurality of different resonance spectra waveforms includes a first resonance spectra waveform and a second resonance spectra waveform. The processing system is further configured to detrend the first resonance spectra waveform and the second resonance spectra waveform and identify a presence or an absence of a structural mode of the component using the first resonance spectra waveform and the second resonance spectra waveform. The presence of the structural mode is identified by determining the first resonance spectra waveform includes a maximum slope point at a first frequency of the portion of the frequency range and the second resonance spectra waveform includes a second peak at a second frequency of the portion of the frequency range.


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Coleman, Ronald. (2026). Resonance inspection system and method for using same (U.S. Patent No. 12704482). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12704482

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