The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Jul. 11, 2023
Applicant:

The Steelastic Company, Llc, Cuyahoga Falls, OH (US);

Inventors:

Jacob James Mudger, Salem, OH (US);

Daniel Duane Hawk, Akron, OH (US);

Assignee:

The Steelastic Company, LLC, Cuyahoga Falls, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/72 (2006.01); G01J 5/00 (2022.01);
U.S. Cl.
CPC ...
G01N 25/72 (2013.01); G01J 2005/0077 (2013.01);
Abstract

A defect detection system and method for detecting the presence of a defect in an extruded strip can include various elements. In examples, a thermal imagining sensor is used to detect a plurality of surface temperatures on a surface of the extruded strip. A processing unit is configured to generate a thermal map of an area of the surface of extruded strip. The processing unit is further configured to determine whether the plurality of surface temperatures are outside a tolerance range, indicating the presence of a defect in the extruded strip. Detecting a defect during the extrusion process can help achieve the goal of reducing manufacturing waste and increasing quality control.


Find Patent Forward Citations

Mudger, Jacob. (2026). Defect detection of extruded strip (U.S. Patent No. 12704473). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12704473

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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