The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Mar. 30, 2021
Applicant:

Siemens Industry Software Inc., Plano, TX (US);

Inventor:

Tova Yadin, Mazkeret Batya, IL;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01N 21/9501 (2013.01); G01N 2021/8874 (2013.01);
Abstract

Systems and a method for detecting a false error in a set of errors detected on components of a board that is inspected by an automated optical inspection (AOI) machine. Input data are received. The input data include data originating from AOI machine's inspection results of a given inspected board marked as failed. A false error detector is applied to the input data. The detector is modeled with a trained function and the detector generates output data. The output data determines whether or not at least one of the component errors that are reported by the AOI machine for the given board is a false error.


Find Patent Forward Citations

Yadin, Tova. (2026). Method and system for detecting a false error on a component of a board inspected by an aoi machine (U.S. Patent No. 12704464). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12704464

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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