The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12704458 B1

Date of Patent:

Aug. 11, 2026

Filed:

Jun. 02, 2023

Critical angle reflection imaging for quantification of molecular interactions

Applicant:

Arizona Board of Regents on Behalf of Arizona State University, Scottsdale, AZ (US);

Inventors:

Shaopeng Wang, Chandler, AZ (US);

Runli Liang, Mesa, AZ (US);

Guangzhong MA, Tempe, AZ (US);

Assignee:

ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY, SCOTTSDALE, AZ (US);

Primary Examiner:

XING, CHRISTINA ILONA

Int. Cl.

CPC ...

U.S. Cl.

CPC ...

G01N 21/43 ; G01N 21/553 ; G01N 21/648 ; G01N 33/542 ; G01N 2021/437 ;

Find Patent Forward Citations

Wang, Shaopeng. (2026). Critical angle reflection imaging for quantification of molecular interactions (U.S. Patent No. 12704458). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12704458

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile