The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Jan. 12, 2023
Applicants:

Marunaka Co., Ltd., Aichi, JP;

Toyota Jidosha Kabushiki Kaisha, Aichi-ken, JP;

Inventors:

Mitsugu Nakagawa, Aichi, JP;

Kyojiro Inoue, Toyota, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/20 (2006.01);
U.S. Cl.
CPC ...
G01M 3/20 (2013.01);
Abstract

An apparatus for leak test is provided with: a gas dissolution portion having function to degasify a unused liquid; a liquid filling and circulation portion for filling the gas dissolved liquid in the test piece; a high-pressure application portion for pressurizing the filled gas dissolved liquid; a leak test portion for detecting the gas in the liquid vapor leaking out in the vacuum container from leak hole(s) of the test piece resulting from high-pressure application; and a liquid collection portion for collecting the gas dissolved liquid as relieving high pressure. The leak test process under high pressure is conducted in the closed circulated flow path. The leak test process uses the liquid easy for gas to be dissolved and to flow through the leak hole(s). Further, the leak test process uses the gas easy to dissolve in the liquid or to be detected.


Find Patent Forward Citations

Nakagawa, Mitsugu. (2026). Apparatus and method for leak test (U.S. Patent No. 12704431). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12704431

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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