The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Dec. 20, 2024
Applicant:

Fenix Research Corporation, Palo Alto, CA (US);

Inventor:

Yong Jin Lee, Palo Alto, CA (US);

Assignee:

Fenix Research Corporation, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/30 (2006.01); G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
G01J 3/30 (2013.01); G01J 1/4257 (2013.01);
Abstract

A system and method are provided for characterizing a laser using a diffraction grating. The system includes a lens that projects diffraction patterns from the diffraction grating as an image of diffraction peaks onto a plane. Optical sensors then sense the diffraction peaks. A processor connected to the optical sensors applies the laser characterization method to determine the laser wavelength, irradiance and angle of incidence. In the method, the processor obtains the diffraction peak measurements from the optical sensors and applies a transform to arrange the diffraction peaks into a grid of regularly spaced peaks. The processor then applies convolution kernels to analyze the grid of regularized peaks to determine a wavelength, irradiance and angle of incidence of the laser.


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Lee, Yong. (2026). Laser detector (U.S. Patent No. 12704410). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12704410

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