The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2026
Filed:
Aug. 01, 2022
Ntt, Inc., Tokyo, JP;
Hiroshi Takahashi, Musashino, JP;
Yoshifumi Wakisaka, Musashino, JP;
Daisuke Iida, Musashino, JP;
Yusuke Koshikiya, Musashino, JP;
NTT, Inc., Tokyo, JP;
Abstract
An optical path testing device and an optical path testing method divide output light from a laser light source into a probe optical path and a local optical path and convert modulated light obtained by modulating input light of the probe optical path into probe light including pulsed light, generate a beat signal by causing signal light and input light of the local optical path to interfere with each other, acquire a signal indicating backscattered light in the optical fiber on the basis of the beat signal, and analyzes a loss distribution, when generating the modulated light, perform first modulation and second modulation, and generate an analysis signal by averaging the backscattered light in each different frequency band included in the beat signal between the different frequency bands and acquire the loss distribution by analyzing an intensity of the backscattered light included in the analysis signal.