The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Mar. 27, 2024
Applicant:

Blackbox Biometrics, Inc., Rochester, NY (US);

Inventors:

Angela D'orazio, Rochester, NY (US);

Bradford Laundry, Rochester, NY (US);

Philip Moise, Rochester, NY (US);

Assignee:

BlackBox Biometrics, Inc., Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01H 3/12 (2006.01); G01H 5/00 (2006.01); G01L 5/00 (2006.01); G01L 5/14 (2006.01); G01L 5/16 (2020.01); G01L 19/00 (2006.01); G01L 23/08 (2006.01);
U.S. Cl.
CPC ...
G01H 3/12 (2013.01); G01H 5/00 (2013.01); G01L 5/0052 (2013.01); G01L 5/14 (2013.01); G01L 5/16 (2013.01); G01L 19/0092 (2013.01); G01L 23/08 (2013.01);
Abstract

Systems and methods for a directional blast gauge including a plurality of blast sensors are disclosed, including a first blast sensor having a first power consumption metric when in operation and two or more second blast sensors having a second power consumption metric lower than the first power consumption metric, wherein positions of the first blast sensor and the two or more second blast sensors define a first plane, and a control circuit configured to measure a blast overpressure waveform of an event using the first blast sensor and to determine time differential data of the event using the two or more second blast sensors.


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