The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Aug. 15, 2024
Applicant:

Tdk-micronas Gmbh, Freiburg, DE;

Inventors:

Joerg Franke, Freiburg, DE;

Johannes Gutmann, Staufen, DE;

Assignee:

TDK-Micronas GmbH, Freiburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/30 (2006.01); G01D 5/14 (2006.01); G01D 5/16 (2006.01);
U.S. Cl.
CPC ...
G01B 7/30 (2013.01); G01D 5/145 (2013.01); G01D 5/16 (2013.01);
Abstract

A method for compensating angular errors when determining angular values of an arrangement with a permanent magnet and at least two magnetic field sensors. A distance is formed between the permanent magnet and the magnetic field sensors in which a sine signal and a cosine signal are generated. An evaluation signal corresponding to the angular values is formed from the two signals using an arc tangent function, wherein arrangement errors and errors of a measurement and evaluation unit change the shape of the evaluation signal and lead to an angular deviation in the evaluation signal. To minimize the angular deviation, offset values of the signals are changed and offset values are ascertained by determining a first harmonic in the evaluation signal and/or a second harmonic in the signals and/or density differences of measurement points of a Lissajous curve.


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