The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Dec. 14, 2022
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventor:

Hsin-Chang Chang, Taichung, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 17/09 (2006.01);
U.S. Cl.
CPC ...
B23Q 17/0995 (2013.01); B23Q 17/0985 (2013.01); B23Q 17/099 (2013.01);
Abstract

A method for evaluating tool health with the temperature rising signal, applied to a machine tool that utilizes a tool to perform a removal process upon a workpiece, comprises the steps of: setting a target machining instruction; utilizing a processor to divide the target machining instruction into a residual machining instruction and a micro machining instruction; performing the residual machining instruction; without any coolant or with little coolant, performing the micro machining instruction, and having at least one thermal image sensor to detect a thermal image of a contact area of the tool and the workpiece; having the processor to derive a temperature feature by evaluating the thermal image; and, having the processor to compare the temperature feature with at least one threshold for determining the tool health.


Find Patent Forward Citations

Chang, Hsin-Chang. (2026). Method for evaluating tool health with the temperature rising signal (U.S. Patent No. 12703055). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12703055

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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