The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2026
Filed:
Nov. 03, 2022
Applicant:
Diagnostic Consulting Network, Llc, Carlsbad, CA (US);
Inventors:
Brian Taylor Daugherty, Carlsbad, CA (US);
William Patrick Coffey, Carlsbad, CA (US);
Assignee:
DIAGNOSTIC CONSULTING NETWORK, LLC, Carlsbad, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); G01N 21/31 (2006.01); G01N 21/64 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
B01L 3/5023 (2013.01); G01N 21/31 (2013.01); G01N 21/64 (2013.01); G01N 21/8483 (2013.01); B01L 2300/021 (2013.01); B01L 2300/069 (2013.01); B01L 2300/0825 (2013.01);
Abstract
Lateral flow analyte test systems having a defined geometry that positions a light source at a position relative to a test strip so that a captured image of the test strip is not convoluted with specular reflection, and that permits the light source to illuminate the desired portion of the test strip without the creation of a shadow in the image by the optics of the test strip reader.