The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Jun. 28, 2024
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Sanguk Kim, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/42 (2024.01); G01T 1/02 (2006.01);
U.S. Cl.
CPC ...
A61B 6/542 (2013.01); A61B 6/4241 (2013.01); G01T 1/02 (2013.01);
Abstract

Provided are an X-ray detector automatically correcting an automatic exposure control (AEC) sensing area, based on an image obtained using an AEC sensor array, and a method of operating the X-ray detector. The X-ray detector may detect, using an AEC sensor array, X-rays that have passed through an object, obtain a one-dimensional (1D) image by quantifying a dose of the detected X-rays into a signal value, identify a symmetric point from the 1D image, based on a signal value for each pixel of the 1D image, and adjust respective locations of a plurality of AEC sensing areas so that the plurality of AEC sensing areas are symmetrical to each other with respect to the identified symmetric point.


Find Patent Forward Citations

Kim, Sanguk. (2026). X-ray detector comprising aec sensor, and operating method therefor (U.S. Patent No. 12702375). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12702375

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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