The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Sep. 15, 2023
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Takafumi Yukimori, Tokyo, JP;

Yoko Tatara, Tokyo, JP;

Makoto Saika, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/02 (2006.01); A61B 3/024 (2006.01); A61B 3/028 (2006.01); A61B 3/032 (2006.01); A61B 3/06 (2006.01); A61B 3/08 (2006.01); A61B 3/10 (2006.01); A61B 3/103 (2006.01);
U.S. Cl.
CPC ...
A61B 3/103 (2013.01); A61B 3/022 (2013.01); A61B 3/024 (2013.01); A61B 3/028 (2013.01); A61B 3/032 (2013.01); A61B 3/063 (2013.01); A61B 3/08 (2013.01); A61B 3/10 (2013.01);
Abstract

An ophthalmologic apparatus includes an objective measurement optical system that measures an objective refraction characteristic of a subject eye and a control portion that performs total control including control of the objective measurement optical system, wherein the control portion analyzes a characteristic amount of a ring image obtained by measuring the objective refraction characteristic of the subject eye to feedback to a subjective examination content of the subject eye according to an analysis result of the characteristic amount of the ring image.


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