The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
Jan. 15, 2025
Lx Semicon Co., Ltd., Daejeon, KR;
Jin Ho Lee, Daejeon, KR;
Jung Won Kang, Daejeon, KR;
Hyun Suk Ko, Daejeon, KR;
Sung Chang Lim, Daejeon, KR;
Ha Hyun Lee, Seoul, KR;
Dong San Jun, Daejeon, KR;
Hui Yong Kim, Daejeon, KR;
LX SEMICON CO., LTD., Daejeon, KR;
Abstract
An image encoding/decoding method and apparatus for performing intra prediction using a plurality of reference sample lines are provided. An image decoding method may include receiving image information including intra prediction mode information, deriving an intra prediction mode of a current block based on the intra prediction mode information, and determining at least one reference sample line for intra prediction of a current block among a plurality of reference sample lines by selecting the at least one reference sample line. Based on an upper boundary of the current block corresponding to an upper boundary of a current coding tree block including the current block, a first reference sample line among the plurality of reference sample lines can be determined as the at least one reference sample line for intra prediction of the current block.