The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Nov. 28, 2023
Applicant:

Meta Platforms Technologies, Llc, Menlo Park, CA (US);

Inventors:

Dong Zhang, Coquitlam, CA;

Yujia Huang, Kirkland, WA (US);

Peicong Wu, Bellevue, WA (US);

Turhan Karadeniz, Oakland, CA (US);

Vadim Goncharuk, Renton, WA (US);

Assignee:

Meta Platforms Technologies, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/327 (2018.01); H04N 13/344 (2018.01); H04N 13/383 (2018.01); H04N 13/398 (2018.01);
U.S. Cl.
CPC ...
H04N 13/327 (2018.05); H04N 13/344 (2018.05); H04N 13/383 (2018.05); H04N 13/398 (2018.05);
Abstract

The disclosed computer-implemented method may include displaying a first test pattern on a first display and a second test pattern on a second display and capturing the displayed first test pattern and the displayed second test pattern. The method may further include determining a deviation between at least one of the captured first test pattern and the first test pattern or the captured second test pattern and the second test pattern. The method may also include adjusting output to at least one of the first display or the second display based on the determined deviation. Various other methods, systems, and computer-readable media are also disclosed.


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