The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Nov. 20, 2023
Applicant:

Cypress Semiconductor Corporation, San Jose, CA (US);

Inventors:

Avik Santra, Irvine, CA (US);

Kiran Uln, Pleasanton, CA (US);

Rakesh Taori, McKinney, TX (US);

Niall Lyons, Irvine, CA (US);

Ashutosh Pandey, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/01 (2006.01); H04B 7/06 (2006.01);
U.S. Cl.
CPC ...
H04B 7/0626 (2013.01); H04B 7/01 (2013.01);
Abstract

Methods and systems for communication and sensing systems. The disclosed method includes, among other things, responsive to receiving a plurality of channel frequency response (CFR) measurements from an antenna operating at a low-bandwidth range, generating a channel state information (CSI) across a high-bandwidth range based on the plurality of CFR measurements and determining, based on the CSI, a Doppler shift across the high-bandwidth range.


Find Patent Forward Citations

Quick Actions:

Santra, Avik. (2026). Spectral and spatial stitching for radio frequency sensing (U.S. Patent No. 12700902). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12700902

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…