The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Nov. 23, 2022
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Hikaru Kurasawa, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/58 (2022.01); G06V 10/774 (2022.01);
U.S. Cl.
CPC ...
G06V 10/7747 (2022.01); G06V 10/58 (2022.01);
Abstract

A method according to the present disclosure includes selecting a reference class from a plurality of classes, calculating a plurality of degrees of similarity between a feature spectrum corresponding to target training data and a plurality of the feature spectra belonging to the reference class, applying, to the plurality of degrees of similarity, a defectiveness function that is determined in advance, and calculating a defectiveness index with respect to the target training data, and determining whether the target training data is the defective data, based on a result of comparison between the defectiveness index and a threshold value.


Find Patent Forward Citations

Kurasawa, Hikaru. (2026). Method of extracting unsuitable and defective data from plurality of pieces of training data used for learning of machine learning model, information processing device, and non-transitory computer-readable storage medium storing computer program (U.S. Patent No. 12700223). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12700223

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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