The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Aug. 28, 2023
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yuki Yamaguchi, Tokyo, JP;

Taichi Tanaka, Tokyo, JP;

Masato Toda, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G01S 13/90 (2006.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01); G01S 13/9021 (2019.05); G06V 10/761 (2022.01);
Abstract

The signal processing deviceincludes a three-dimensional information with reliability reconstruction unit which generates three-dimensional information with reliability including three-dimensional information involving intensity and an estimated value of a phase at a three-dimensional position reconstructed using observed SAR images and imaging conditions, and information indicating reliability of the three-dimensional information, and a phase signal estimation unitwhich calculates phase signals for all pixels in an analyzed area for all imaging conditions of SAR images to be analyzed, and calculates the information indicating reliability of the phase signals based on the information indicating reliability of the three-dimensional information.


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