The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Jun. 02, 2020
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Jonathan Liu, Tokyo, JP;

Hitoshi Shimizu, Tokyo, JP;

Hisashi Tsukada, Hachioji, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/08 (2011.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/135 (2006.01); A61B 3/14 (2006.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 15/08 (2013.01); A61B 3/0008 (2013.01); A61B 3/0025 (2013.01); A61B 3/0058 (2013.01); A61B 3/0083 (2013.01); A61B 3/102 (2013.01); A61B 3/135 (2013.01); A61B 3/14 (2013.01); G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06T 2207/30041 (2013.01);
Abstract

A slit lamp microscope of some aspect examples includes a scanner and a rendering processor. The scanner is configured to scan an anterior segment of a subject's eye with slit light to collect a plurality of cross sectional images. The rendering processor is configured to apply rendering to a three dimensional image created from the plurality of cross sectional images.


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