The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
Jun. 13, 2022
Applicants:
Safran, Paris, FR;
Association Pour LA Recherche ET Le Développement Des Méthodes ET Processus Industriels (A.r.m.i.n.e.s.), Paris Cedex, FR;
Inventors:
Clément Remacha, Moissy-Cramayel, FR;
Guillaume Redoules, Moissy-Cramayel, FR;
Axel Aublet, Moissy-Cramayel, FR;
Assignees:
Safran, Paris, FR;
Association pour la Recherche et le Développement des Méthodes et Processus Industriels (A.R.M.I.N.E.S.), Paris Cedex, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/10 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/10 (2017.01); G06T 2207/10072 (2013.01);
Abstract
A method for determining the presence of at least one defect in a three-dimensional part on the basis of a reference base, wherein: