The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

May. 22, 2023
Applicant:

Nanjing University of Aeronautics and Astronautics, Nanjing, CN;

Inventors:

Jun Wang, Nanjing, CN;

Zhongde Shan, Nanjing, CN;

Li Dai, Nanjing, CN;

Dawei Li, Nanjing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/77 (2022.01); G06V 10/80 (2022.01); G06V 20/70 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06V 10/7715 (2022.01); G06V 10/806 (2022.01); G06V 20/70 (2022.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A cross-scale defect detection method based on deep learning, including: (S) building a vision data acquisition system to acquire a surface image of a part to be processed; and building a defect dataset; (S) building a deep learning-based cross-scale defect detection model; and inputting the defect dataset obtained in the step (S) into the deep learning-based cross-scale defect detection model for model training; and (S) building a defect detection system according to the deep learning-based cross-scale defect detection model and the vision data acquisition system; and detecting a defect of the surface image of the part to be processed.


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