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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12699942 B1

PDFFull Text
Date of Patent:
Aug. 04, 2026

Filed:

Jun. 30, 2023

Early warning for issue due date revision using machine learning model

Applicant:

Wells Fargo Bank, N.a., San Francisco, CA (US);

Inventors:

Michael Goodwin, Arlington, TX (US);

Xiangchen Huo, Dallas, TX (US);

Antonio Iniguez, Mesa, AZ (US);

Brian Karp, Denver, CO (US);

Jody Vandever, Earlham, IA (US);

Robin Baldeo, Charlotte, NC (US);

Sooji Ha, Moorestown, NJ (US);

Efa Shukarey, Woodbury, MN (US);

Prashamsh Takkalapally, Cumming, GA (US);

Tsai-Hsuan Tsai, Harrison, NJ (US);

Assignee:

Wells Fargo Bank, N.A., San Francisco, CA (US);

Attorney:

Shumaker & Sieffert, P.A.

Primary Examiner:

Hafiz A Kassim

Int. Cl.
CPC ...
G06Q 10/00 (2026.01); G06Q 10/0631 (2023.01); G06Q 10/0635 (2023.01);
U.S. Cl.
CPC ...
G06Q 10/0635 (2013.01); G06Q 10/06312 (2013.01);
Abstract

A computing system receives issue data for a plurality of issues from a risk management system. The issue data for each respective issue of the plurality of issues includes an issue identifier and a due date for resolution of the respective issue. The computing system generates due date revision risk scores for the plurality of issues. A due date revision risk score for the respective issue indicates a predicted probability that the due date for resolution of the respective issue will need revision within a fixed period of time. The computing system generates a warning message for at least the respective issue of the plurality of issues based on the due date revision risk score for the respective issue being greater than a threshold. The computing system revises parameters of the at least one machine learning model based on due date revision outcomes associated with the plurality of issues.

Find Patent Forward Citations

Goodwin, Michael. (2026). Early warning for issue due date revision using machine learning model (U.S. Patent No. 12699942). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12699942

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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