The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
May. 06, 2024
Dell Products, L.p., Hopkinton, MA (US);
Lixin Pang, Needham, MA (US);
Rong Yu, West Roxbury, MA (US);
Dell Products, L.P., Hopkinton, MA (US);
Abstract
A statistics and feedback-based diagnostic scan framework for cluster nodes is provided, that prioritizes work items for processing by cluster nodes according to work item priority. A heatmap of work items is created and used by the diagnostic scan framework to prioritize work items for processing by the cluster nodes. The heatmap may be created from runtime IO operations, metadata access/updates, or other metrics derived from systems executing within the storage system. Additionally, as cluster nodes process allocated work items, the results of the scan operations are used to update the heat map to adjust the heat map based on the results of the previous scan operations. The heat map may prioritize individual work items or may create regions of work items and prioritize processing of work items according work item region.