The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
Feb. 22, 2024
Red Hat, Inc., Raleigh, NC (US);
William J. Caban Babilonia, Annapolis, MD (US);
Erik M. Jacobs, Atlanta, GA (US);
Guarav Singh, Columbus, OH (US);
Benjamin Michael Parees, Raleigh, NC (US);
Red Hat, Inc., Raleigh, NC (US);
Abstract
A system can be provided for to evaluating artificial intelligence (AI) generated structure language files. For example, the system can receive a first structured language file generated by a large language model (LLM). The first structured language file can include generated keys and generated values for a resource. The system can also receive a second structured language file, which can include test keys and test values for the resource. The system can further extract, using a schema for the resource, resource keys. The system can determine, based on a comparison of the generated keys and the resource keys, a valid key total. Similarly, the system can determine, based on a comparison of the generated values and the test values, a valid value total. The system can then generate performance metrics for the LLM. Each performance metric can depend on the valid key total or the valid value total.