The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
Jul. 06, 2022
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Li Zhang, Beijing, CN;
Qingping Huang, Beijing, CN;
Yong Zhou, Beijing, CN;
Hui Ding, Beijing, CN;
Xin Jin, Beijing, CN;
Chao Ji, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
An inspection system, including: at least one ray source rotatable between at least two scanning positions around a rotation axis, and a rotation angle of at least one ray source between two adjacent scanning positions is greater than an angle of adjacent target spots of each ray source relative to the rotation axis; a detector assembly, and a conveying device configured to carry an object to be inspected. At least one ray source and the detector assembly are movable in a traveling direction relative to the conveying device, so that the object to be inspected may enter an inspection region. When at least one ray source is located at one scanning positions, at least one ray source and the detector assembly move in the traveling direction relative to the conveying device and at least one ray source emits X-rays; after moving a predetermined distance, at least one ray source rotates around the rotation axis to another scanning position.