The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Jan. 09, 2024
Applicant:

Novatel Inc., Calgary, CA;

Inventors:

Ali Broumandan, Calgary, CA;

Vahid Dehghanian, Calgary, CA;

Isabelle Tremblay, Calgary, CA;

Assignee:

NovAtel Inc., Calgary, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/23 (2010.01); G01S 19/54 (2010.01);
U.S. Cl.
CPC ...
G01S 19/235 (2013.01); G01S 19/54 (2013.01);
Abstract

Techniques are provided for estimating a line bias of a multi-antenna array. Diff-carrier phase (CP) values may be calculated based on navigation signals received at two antennas of the multi-antenna array. An integer portion may be removed from each diff-CP value. A baseline vector and a fine line bias estimate may be calculated for each of the plurality of candidate line bias value by executing an algorithm that uses each candidate with fractional diff-CP measurements that are corrected for the candidate that is being tested. Output of a test statistic method (e.g., sum of residual squares) and the smallest fine line bias estimate may be used to identify a particular candidate line bias value. The smallest fine line bias estimate may be added to the chosen candidate to calculate the line bias between the two antennas. Calibration of the multi-antenna array and attitude determination can be jointly performed.


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