The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
Jan. 23, 2024
Texas Instruments Incorporated, Dallas, TX (US);
Sujaata Ramalingam, Bangalore, IN;
Karthik Subburaj, Bangalore, IN;
Pankaj Gupta, Dausa, IN;
Anil Varghese Mani, Bangalore, IN;
Karthik Ramasubramanian, Bangalore, IN;
Indu Prathapan, Bangalore, IN;
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
In a system a register stores data samples and includes a cell under test (CUT) in which a test data sample is stored, a first window of multiple cells on one side of the CUT, and a second window of multiple cells on the other side of the CUT. A rank determining circuit receives an incoming data sample entering the register and data sample(s) currently in cell(s) in the first window of multiple cells. A sorted index array stores ranks of data samples that are stored in the register. Comparing and selection circuitry selects a Kth smallest index from the sorted index array and a corresponding data sample from the register. A target comparator receives the test data sample and the data sample corresponding to the Kth smallest index of the sorted index array, and outputs a target detection signal.