The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Sep. 02, 2025
Applicant:

Auradine, Inc., Santa Clara, CA (US);

Inventor:

David Carlson, Haslet, TX (US);

Assignee:

Auradine, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); H04L 9/06 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31724 (2013.01); H04L 9/0643 (2013.01);
Abstract

The present disclosure generally relates to using built-in self-test (BIST) for on-chip error detection. In some aspects, a method includes receiving information about one or more parameters for a built-in self-test (BIST) operation, generating a nonce for each iteration of the BIST operation according to the one or more parameters, and computing a hash value for each iteration of the BIST operation using the nonce as an input to a cryptographic hash function. The method further includes transmitting, to multiple hash engines, information about the nonce and the hash value for each iteration of the BIST operation. The method further includes receiving, from each hash engine, a response with information indicating a number of correct results computed by that hash engine. The method further includes comparing the indicated number of correct results to an expected number of correct results for the BIST operation.


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