The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Oct. 06, 2021
Applicant:

Dh Technologies Development Pte. Ltd., Singapore, SG;

Inventors:

Stephen A. Tate, Barrie, CA;

Lyle Lorrence Burton, Woodbridge, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8679 (2013.01); G01N 30/8631 (2013.01); G01N 30/72 (2013.01); G01N 30/8655 (2013.01);
Abstract

A compound is separated or introduced from a sample at a plurality of different times. The compound is ionized, producing an ion beam. The compound is selected and mass analyzed or the compound is selected, fragmented, and fragments of the compound are analyzed from the ion beam at the plurality of different times, producing a plurality of mass spectra. An XIC is calculated for the compound using the plurality of mass spectra. A chemical structure of the compound received in notation form is converted to a numerical vector using a processing algorithm operable to convert the notation form to the numerical vector. A plurality of peak shape parameters is calculated for the compound using the numerical vector and a machine trained model. A peak of the XIC is identified as a peak of the compound using the plurality of peak shape parameters and optionally a peak integration algorithm.


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