The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
Jan. 02, 2024
Applicant:
Rohr, Inc., Chula Vista, CA (US);
Inventors:
Ee Hwee Lim, Singapore, SG;
Pravin Ishwardas Rajwani, Singapore, SG;
Ann Soon Anson Tan, Singapore, SG;
Assignee:
ROHR, INC., Chula Vista, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/265 (2006.01); G01N 29/22 (2006.01);
U.S. Cl.
CPC ...
G01N 29/265 (2013.01); G01N 29/223 (2013.01);
Abstract
An apparatus for non-destructive testing of a component is disclosed herein. The apparatus comprises a robotic arm, a probe holder, a probe connected to the robotic arm via the probe holder, and a controller configured to move the robotic arm to move the probe over a surface of a component to be tested. The probe holder comprises a spring assembly for biasing the probe towards the surface of the component to be tested to keep the probe in contact therewith. The spring assembly comprises at least one pair of spring portions that are spaced apart along a first axis.