The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
May. 15, 2024
Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, CN;
Qinghua Yu, Shanghai, CN;
Abstract
A method for absolute phase measurement for complex coherence coefficient of an object comprises: firstly, processing fringe data measured by interferometry on any aperture pairs of an equivalent pupil plane of an optical imaging system to obtain an interference term and envelope and extreme values thereof; secondly, selecting extreme value A of light intensity from an interval of relatively stable extreme values change on one side of a curve envelope with zero optical path difference, and selecting two extreme values B and C of light intensity closest to extreme value A on other side of the curve envelope with zero optical path difference, where B>A≥C or C>A≥B; thirdly, counting number of fringe periods between A and C or A and B; and fourthly, according to the number of fringe periods, selecting a formula to calculate absolute phase of complex coherence coefficient of the object.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile