The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Mar. 29, 2022
Applicant:

Hitachi Construction Machinery Co., Ltd., Tokyo, JP;

Inventors:

Akira Kanazawa, Tokyo, JP;

Ryu Narikawa, Tokyo, JP;

Shinjirou Yamamoto, Tsuchiura, JP;

Takaaki Chiba, Tsuchiura, JP;

Shinya Imura, Tsuchiura, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E02F 9/24 (2006.01); E02F 9/20 (2006.01);
U.S. Cl.
CPC ...
E02F 9/24 (2013.01); E02F 9/2033 (2013.01);
Abstract

An object of the present invention is to provide a work management system that enables efficient extraction of approach events that are likely to result in contact between a work machine and a worker. For this object, a management server assesses whether or not there is approach between a work machine and a worker, on the basis of positional information about the work machine measured by a work machine position measuring apparatus, and positional information about the worker measured by a worker position measuring apparatus, and, when assessing that there is approach, assesses an approached state of the approach from a state of the work machine measured by a work machine state measuring apparatus at the time of the assessment of the approach, on the basis of a preset approached state definition, and records the state of the work machine measured at the time of the assessment of the approach, in association with the approached state, and outputs the state of the work machine to a display apparatus in association with the approached state.


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