The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
Mar. 14, 2019
Hitachi High-tech Corporation, Tokyo, JP;
Ihu Mediterranee Infection, Marseilles Cédex, FR;
Shigeki Matsubara, Tokyo, JP;
Yuusuke Oominami, Tokyo, JP;
Kyoko Imai, Tokyo, JP;
Takashi Irie, Tokyo, JP;
Didier Raoult, Marseilles Cédex, FR;
Jacques Bou Khalil, Marseilles Cédex, FR;
Hitachi High-Tech Corporation, Tokyo, JP;
IHU Mediterranee Infection, Marseilles Cedex, FR;
Abstract
The purpose of this invention is to provide an inspection method which enables us to judge a microbe's chemical susceptibility quickly, versatile and cheap. The inspection method of this invention's one aspect comprises a step for judging the chemical susceptibility to the antimicrobial of the microbe based on appearance-changing of the observed microbe. The step for judging may judge the chemical susceptibility by obtaining a feature of the plurality of images in the database regarding a plurality of images of microbes which have already been confirmed that they are resistant microbes and a plurality of images of microbes which have already been confirmed that they have susceptibility to an antimicrobial by machine learning and by comparing the images of the microbes with the images in the database based on the feature. Furthermore, the step for judging may judge the chemical susceptibility based on an abundance ratio of the microbe whose appearance changed out of the microbe in the field.