The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Mar. 17, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Kenta Fujii, Tokyo, JP;

Motoaki Nishiwaki, Tokyo, JP;

Kyohei Ishikawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/38 (2014.01); B23K 26/03 (2006.01); B23K 26/70 (2014.01); B23K 31/00 (2006.01);
U.S. Cl.
CPC ...
B23K 26/38 (2013.01); B23K 26/03 (2013.01); B23K 26/032 (2013.01); B23K 26/702 (2015.10); B23K 31/006 (2013.01);
Abstract

A control device that executes machining to cut a workpiece into a part and a remaining material; a detection unit that determines, as a time-series signal, a result of observing in time series a state of the workpiece; a machining state evaluation unit that determines, as evaluation information, a result of evaluation on a state of the machining for each of sections obtained by dividing the machining path, based on the time-series signal; an evaluation information storage unit that stores contour line evaluation information in which a contour line is associated with the evaluation information; and a sorting operation determination unit that determines a sorting control command for controlling sorting operation in which the part is taken out from a position where the workpiece is machined and moved to a target position, based on the contour line evaluation information; are provided.


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