The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Jun. 04, 2021
Applicant:

The Trustees of Indiana University, Bloomington, IN (US);

Inventors:

Jie Chen, Carmel, IN (US);

Dongcai Wang, Indianapolis, IN (US);

Assignee:

The Trustees of Indiana University, Bloomington, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61C 19/04 (2006.01); A61C 7/00 (2006.01);
U.S. Cl.
CPC ...
A61C 19/04 (2013.01); A61C 7/002 (2013.01);
Abstract

An orthodontic force measurement system that enables duplication of the patient's dentition for the application of appliances in a simulated clinical condition. Six components of the load system on individual teeth can be measured. The device can take patient-specific information, such as shapes and locations of the teeth, and duplicate them on the device. Clinicians will be able to apply different appliances to the denture and measure the load system on specific teeth. By accurately quantifying force/moments on individual teeth, individualized, predictable patient-specific orthodontic treatments can be implemented.


Find Patent Forward Citations

Chen, Jie. (2026). Orthodontic force measurement system for personalized treatments (U.S. Patent No. 12697198). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12697198

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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