The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Jul. 12, 2022
Applicant:

Canon Kabishiki Kaisha, Tokyo, JP;

Inventors:

Xiaohui Zhan, Vernon Hills, IL (US);

Ilmar Hein, Vernon Hills, IL (US);

Ruoqiao Zhang, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/42 (2024.01); G01T 1/17 (2006.01); G01T 1/24 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4241 (2013.01); A61B 6/032 (2013.01); A61B 6/4233 (2013.01); G01T 1/17 (2013.01); G01T 1/247 (2013.01); G01T 1/2985 (2013.01);
Abstract

A photon counting detector (PCD) apparatus includes a PCD array including a plurality of micro-pixels positioned in at least one of a channel direction and a row direction; and processing circuitry configured to: receive signals from each of the plurality of micro-pixels; configure the PCD array to include (a) a first micro-pixel area including a first group of plural micro-pixels of the plurality of micro-pixels and (b) a second micro-pixel area including a second group of plural micro-pixels of the plurality of micro-pixels, such that a portion of the first and second groups of plural micro-pixels overlap between the first and second groups; bin the signals from the first group of plural micro-pixels into a first virtual bin value; and bin the signals from the second group of plural micro-pixels into a second virtual bin value.


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