The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2026
Filed:
Mar. 11, 2022
Rodenstock Gmbh, Munich, DE;
Stephan Trumm, Munich, DE;
Adam Muschielok, Munich, DE;
Wolfgang Becken, Neuried, DE;
Yohann Bénard, Munich, DE;
Anne Seidemann, Munich, DE;
Rodenstock GmbH, Munich, DE;
Abstract
A method for determining a sensitivity of at least one eye of a test subject, including: determining a subjective refraction result for the at least one eye of the test subject; while determining the subjective refraction result, determining a first visual acuity of the at least one eye for a first applied refraction; while determining the subjective refraction result, determining a second visual acuity of the at least one eye for a second applied refraction, wherein the second applied refraction is different from the first applied refraction; and ascertaining the sensitivity of the at least one eye, considering the first and second visual acuities at the first and second applied refractions.